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Online Longitudinal Bunch Profile and Slice Emittance Diagnostics at the European XFEL
Online Longitudinal Bunch Profile and Slice Emittance Diagnostics at the European XFEL
2018
Ch. Gerth
Bolko Beutner
O. Hensler
F. Obier
Matthias Scholz
Minjie Yan
Keywords:
Optics
Wafer
Physics
Thermal emittance
Correction
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