A Kind of Resilient Latch Structure Base on Cross-coupled Transistors

In digital circuits, memories, like SRAMs, latches and flip-flops, are extremely susceptible to various radiation effects. This paper proposes a double-node upset (DNU) resilient latch called "Octahedron", which is completely composed of cross-coupled transistors. Advantages with respect to area, power delay product and resilient ability are revealed when our design is compared with previously reported latches. Finally, a formula for coarse estimation of DNU resilient latch failure probability is proposed. Octahedron shows lowest failure probability when the probability of single node upset (SNU) is small.