Disorder-induced covariation of the residual resistance ratio and superconducting Tc of amorphous Zr60Cu40.

Melt-spun ribbons and thin films of amorphous ${\mathrm{Zr}}_{60}$${\mathrm{Cu}}_{40}$ have been studied. Disorder was varied by neutron irradiation, Xe ion irradiation, and condensation on substrates at different temperatures. A correlation was found between the data for the superconducting ${\mathit{T}}_{\mathit{c}}$, and the residual resistance ratio, described by one curve for all samples. Increased electronic disorder was found to be the cause for this correlated depression of ${\mathit{T}}_{\mathit{c}}$ and increasing residual resistance ratio. These results also give evidence for electronic disorder effects in the electrical resistivity of amorphous ${\mathrm{Zr}}_{60}$${\mathrm{Cu}}_{40}$ up to room temperature.