A new detecting system of the beam profile

A new detecting system of the beam profile used in HIRFL(Heavy Ion Research Facility in Lanzhou) is introduced. The detecting system is based on the residual gas ionization principle and consisted of electrostatic collecting plates, micro-channel plates and a resistive anode. The principle and the construction of the system is described. The on-line experiment results are presented. The non-interceptive diagnostic method by using residual gas ionization to detect beam profile is verified.