The crystal structure and electrical properties of solid solutions Nd2−xPrxCuO4

The studies of crystal structure and de electrical conductivity for Nd2-xPrxCuO4 (x = 0, 0.15, 0.3,..., 1.9) are carried out by means of X-ray powder diffraction and the standard four-probe technique, respectively. Nd2-xPrxCuO4 forms continuous solid solutions with body-centered tetragonal unit cell, the lattice parameters increase linearly with increasing Pr content. The transport properties of the samples sintered in different atmospheres are also measured. All samples exhibit a semiconducting behavior, the curves of in rho versus 1/T suggest different conduction mechanisms in different temperature regions.