Old Web
English
Sign In
Acemap
>
Paper
>
Analysis of Cycling Induced Interface Degradation in Si Nanocrystal Memory Devices
Analysis of Cycling Induced Interface Degradation in Si Nanocrystal Memory Devices
2012
Dandan Jiang
Manhong Zhang
Zongliang Huo
Zhong Sun
Yong Wang
Bo Zhang
Junning Chen
Ming Liu
Keywords:
Nanocrystal
Cycling
Electronic engineering
Composite material
Materials science
Nanotechnology
Degradation (geology)
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
1
Citations
NaN
KQI
[]