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Structural characterization of InAs and In 0.25 Ga 0.75 As/GaAs nanostructures grown on GaP(001)
Structural characterization of InAs and In 0.25 Ga 0.75 As/GaAs nanostructures grown on GaP(001)
2012
Christopher Prohl
Yannick Rodriguez Sillke
Andrea Lenz
Josephine Schuppang
Murat Oeztuerk
Gernot Stracke
André Strittmatter
Dieter Bimberg
Holger Eisele
Mario Daehne
Keywords:
Optoelectronics
Molecular beam epitaxy
Thin film
Electron diffraction
Epitaxy
characterization
Quantum dot
Nanostructure
Materials science
Scanning tunneling microscope
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