Upgrade of the TAMU MDM-focal plane detector with MicroMegas technology

Abstract A gridded ionization chamber used as a focal plane detector at the back of the TAMU-MDM spectrometer was modified to use MicroMegas technology for the purpose of improving energy resolution and particle identification. The upgraded system was tested in experimental conditions with several heavy-ion beams at 12 MeV/u and found to achieve resolutions between 3.2% and 4.8%. This is a significant improvement over the previous performance of 10–15% obtained using the existing, conventional ionization chambers.