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A Soft Error Study on Tri-gate based FinFET and Junctionless-FinFET 6T SRAM Cell – A Comparison
A Soft Error Study on Tri-gate based FinFET and Junctionless-FinFET 6T SRAM Cell – A Comparison
2016
P. Chitra
S. Ravi
V.N. Ramakrishnan
Keywords:
Control theory
Computer science
Static random-access memory
Electronic engineering
Soft error
Embedded system
sram cell
Materials science
Correction
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