Atomic force microscopic study of directional SrSO4(001) surface and its etching property

Abstract Different step structures were observed with atomic force microscopy (AFM) on SrSO 4 (001) cleaved in air in two ways. Monolayer steps were observed when the crystal was cleaved by wedging open a crack. On the other hand, bilayer steps were observed when it was cleaved by giving a blow on a knife edge placed along the a -axis on a crystal face. In the latter case, the cleavage proceeded under slightly misoriented tensile stress, favoring formation of bilayer cleavage steps due to alternating directions of the bonds connecting (001) ionic layers. Directionality in the arrangement of the ions at the (001) surface was reflected on the shape of etch pits formed by dissolving the surface in electrolyte solutions. Relative stabilities of the steps surrounding the bow-shaped pits are discussed. The directionality of the surface has potential application in constructing two-dimensional assemblies of functional molecules.