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Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In-Situ Broadband X-ray Laue Diffraction
Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In-Situ Broadband X-ray Laue Diffraction
2012
Andrew Comley
Brian Maddox
R.E. Rudd
Shon Prisbrey
James Hawreliak
Daniel Orlikowski
S. C. Peterson
Joe H. Satcher
Allen Elsholz
H.-S. Park
B. A. Remington
N. Bazin
J. M. Foster
Nigel Park
Paula A. Rosen
Steve Rothman
Andrew Higginbotham
Matthew Suggit
J. S. Wark
Keywords:
Single crystal
X-ray
Analytical chemistry
Tantalum
X-ray crystallography
Optics
Materials science
In situ
Broadband
Correction
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