Promising Method of IC Operation Speed Testing at the Production based on 3-rd Harmonic Measurement

The production test and sorting of high speed communication ICs up to 10 Gb/s, is currently complicated technical task for manufacturer. The relevant IC-test deliverers often utilize the “Catalyst GIGADIG”-instrument for RF-test at high volume and low cost production. However, it’s not applicable for Rise/Fall time measurements at more than several gigabits per second, but able to ensure the productive frequency-domain test up to 6GHz of sine signal. The objective of this work is the investigation and bringing of the prompt solution on ability of non-direct frequency-domain test instead of direct Rise/Fall time measurement for sorting of communication ICs in terms of operation at max speed, such as 8-10Gbps. The intention is to help IC-manufacturers at achieving the low cost and required quality at high volume production test. Ill. 4, bibl. 3 (in English; abstracts in English, Russian and Lithuanian).