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Analysis of Transconductance Degradation after Endurance Cycling of Uniform F-N Flash Memories
Analysis of Transconductance Degradation after Endurance Cycling of Uniform F-N Flash Memories
2002
Y Moriyama
K. Takahashi
K. Ueda
M. Kusumi
K. Sato
I Matsuo
Keywords:
Electronic engineering
Transconductance
Cycling
Materials science
Degradation (geology)
Optoelectronics
Correction
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