The test generation for pulse-induced crosstalk faults Yu.A.Skobtsov, V.Yu.Skobtsov, I.K.M.Nasser

It is considered some approach to pulse- induced crosstalk faults test generation which is based on multi-valued logic and genetic algorithm application. Experimental results for combinational circuits showed an effectiveness of suggested solution in the sense of high fault coverage. Keywords - Crosstalk fault, test generation, Ggnetic algorithms.