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Scanning force microscope forin situnanofocused X-ray diffraction studies
Scanning force microscope forin situnanofocused X-ray diffraction studies
2014
Z. Ren
Francesca Mastropietro
Anton Davydok
Simon Langlais
Marie-Ingrid Richard
Jean-Jacques Furter
Olivier P. Thomas
Maxime Dupraz
Marc Verdier
Guillaume Beutier
Peter Boesecke
Thomas W. Cornelius
Keywords:
Optics
Scanning Force Microscope
Physics
X-ray crystallography
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