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Structural and mechanical characterisation of TiC/VC multilayers using XRD, polarized EXAFS and nanoindentation
Structural and mechanical characterisation of TiC/VC multilayers using XRD, polarized EXAFS and nanoindentation
2002
A. Belger
Bodo Wolf
T. Sebald
T Boettger
P. Paufler
H. Mai
E. Beyer
Keywords:
Crystallography
Nanoindentation
Extended X-ray absorption fine structure
Chemistry
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