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Electric Field-Induced Area Scalability toward the Multilevel Resistive Switching
Electric Field-Induced Area Scalability toward the Multilevel Resistive Switching
2021
Ranveer Singh
Mohit Kumar
Shahid Iqbal
Hyunwoo Kang
Unjeong Kim
Ji-Yong Park
Hyungtak Seo
Keywords:
Scalability
Electric field
Materials science
Resistive random-access memory
Conductive atomic force microscopy
Optoelectronics
resistive switching
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