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Identification of Radiation-Induced Parasitic Leakage Paths Using Light Emission Microscopy
Identification of Radiation-Induced Parasitic Leakage Paths Using Light Emission Microscopy
2004
Marty R. Shaneyfelt
Paiboon Tangyunyong
T.A. Hill
A. Soden
M. Jerry
Richard S. Flores
James R. Schwank
R. Dodd
E. Paul
G.L. Hash
Keywords:
Optoelectronics
light emission
radiation induced
Leakage (electronics)
Microscopy
Materials science
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