A simple method for the determination of noise coefficients P, R, and C by two port noise parameters

In this paper, a simple method for the determination of noise coefficients P, R, and C by standard two-port noise parameters, Fmin, RN and Γopt is presented. The relation between equivalent noise resistance RN and equivalent noise conductance gn has been derived, which greatly simplifies the extraction procedure. This method has been applied to the extraction of Kg/Kc/Kr and P/R/C from 0.15 μm InGaAs PHEMT's with three different sizes at two different biases. Excellent agreement between measured and calculated noise parameters has been found. The tendency of the extracted values with respect to device size and bias is also discussed. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 35: 129–132, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10536