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Development of Niobium Nitride based Highly Sensitive Resistive Probes for Nanoscale Scanning Thermal Microscopy
Development of Niobium Nitride based Highly Sensitive Resistive Probes for Nanoscale Scanning Thermal Microscopy
2018
Rahul Swami
Gwenaelle Julie
Simon Le Denmat
Jean-François Motte
Ali Alkurdi
Pierre-Olivier Chapuis
Séverine Gomès
Olivier Bourgeois
Keywords:
Scanning thermal microscopy
Optoelectronics
Resistive touchscreen
Materials science
Nanoscopic scale
highly sensitive
Niobium nitride
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