Electrical Characterization of Metastable Defects Introduced in GaN by Eu-Ion Implantation

The South African National Research Foundation, the Fund for Scientific Research, Flanders (FWO), the Concerted Action of the KULeuven (GOA/2009/006), the Inter-university Attraction Pole (IAP P6/42) and the Center of Excellence Programme (INPAC EF/05/005).