Inversion of Ultrasonic Scattering Data to Measure Defect Size, Orientation, and Acoustic Properties

1978 
Empirical solutions via the adaptive learnino network methodology have been obtained to measure characteristics of three-dimensional defects (spherical and spheroidal) froa the analysis of theoreticallymodeled scattered waveforms. The solutions ha1e been successfully applied to measure defects from actually observed ultrasonic scattering dati. Spherical voids and inclusions in Ti-6-4, varying in diameter from 0.02 em to 0.12 em, and varying In acoustic impedance ratio !with respect to the host alloy (Ti-6-4)] from zero for air cavities to four for tungsten-carbide inclusions, can be directly measured via: (i) The phase cepstrum which yields an unambiguous measure~ent of defect diameter and is independent of its acoustic impedance ratio; (ii) Adaptive Learning Ketworks (ALN) synthesized from the amplitude spectrum and which yield accurate measurements of defect diameter and the acoustic impedance ratio of the included material. The two empirical solutions. synthesized from the scattering data from an exact model for spheres, yield si~ilar accurate results when applied to actual scattering observed from the defects. Spheroidal defects (oblate spheroids) varyinq in aspect ratio from 1.67 to 6, varying in volume from 20 to 310 millionths of a cubic centimeter, and varyinq in orientation from 0°· to 360" in aziiiiUth and o" to 9o" in elevation, can be measured by adaptive learning networks synthesized from scattering data produced by the Born approximation as the theoretical -odel. Scattering data used to train the ALNs were obtained via computer simulation . As in the case of spheres, the ALNs were trained-using the synthetic waveforms--to predict the defect size and orientation. Once the empirical models were obtained, eight actual defect sizes and orientations wPrP fount1 via the models and these results compare well with the true values. This paper will describe the means by which the inversion of ultrasonic scattering to defect characteristics was accomDllshed and its NDE implications.
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    0
    References
    0
    Citations
    NaN
    KQI
    []