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A Two-Step Tunneling Model for the Stress Induced Leakage Current in Thin Silicon Dioxide Films
A Two-Step Tunneling Model for the Stress Induced Leakage Current in Thin Silicon Dioxide Films
1993
Naoki Yasuda
Nalin Patel
Akira Toriumi
Keywords:
SILC
Quantum tunnelling
Analytical chemistry
Silicon dioxide
Nanotechnology
Materials science
Optoelectronics
two step
Correction
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