Experimental Validation of a Multi-scale Free-space Intra-chip Optical Interconnection Fabric Concept

2006 
In this paper, key aspects of a 3-D optoelectronic application specific interconnection fabric system are demonstrated. The approach uses an array of high-density, precisely oriented micro-prisms that are lithographically fabricated to affect an arbitrary global interconnection fabric
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    3
    References
    1
    Citations
    NaN
    KQI
    []