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A Quantitative Approach to Characterize Total Ionizing Dose Effect of Periphery Device for 65 nm Flash Memory
A Quantitative Approach to Characterize Total Ionizing Dose Effect of Periphery Device for 65 nm Flash Memory
2018
Dandan Jiang
Lei Jin
Zongliang Huo
Keywords:
Absorbed dose
Materials science
Composite material
Analytical chemistry
Flash memory
Optoelectronics
Correction
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