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Dielectric imaging and its frequency dependence of dielectric device using non-contact state microwave probe
Dielectric imaging and its frequency dependence of dielectric device using non-contact state microwave probe
2008
Kakemoto
Li
Hoshina
Tsurumi
Keywords:
Capacitor
Materials science
Microwave probe
Ceramic
Dielectric loss
Permittivity
Microwave imaging
frequency dependence
Dielectric
Optoelectronics
Correction
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