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Structural evolution of nanocrystalline silicon studied by high resolution transmission electron microscopy
Structural evolution of nanocrystalline silicon studied by high resolution transmission electron microscopy
2007
Arturo Ponce
A. Benami
Guillermo Santana
Juan Carlos Alonso
J.R. Aguilar Hernández
G. Contreras-Puente
A. Ortiz
J. Fandiflo
D. Romeu
Keywords:
Materials science
Optoelectronics
Nanocrystalline silicon
structural evolution
High-resolution transmission electron microscopy
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