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In-situ Cryogenic Single-Event Effects Testing of High-Speed SiGe BiCMOS Devices
In-situ Cryogenic Single-Event Effects Testing of High-Speed SiGe BiCMOS Devices
2008
D. Greg Walker
J. D. Black
Jonathan A. Pellish
Michael L. Alles
Robert A. Reed
V. Ramachandran
Keywords:
BiCMOS
Electronic engineering
Electrical engineering
Materials science
In situ
Optoelectronics
Nanotechnology
cryogenic temperature
Correction
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