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Simulations of diagnostic spectrometers for the European XFEL using the ray-trace tool RAY
Simulations of diagnostic spectrometers for the European XFEL using the ray-trace tool RAY
2012
Jens Rehanek
Wolfgang Freund
Alexei Erko
Serguei L. Molodtsov
Franz Schäfers
Michael Scheer
C. Özkan
Jan Grünert
L. Tsakalakos
Keywords:
Spectrometer
Optics
Ray tracing (graphics)
Materials science
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