Terahertz Oscilloscope for Temporal Characterization of Picosecond Relativistic Electron Beam

Terahertz (THz) streaking is a novel method to measure the temporal profile of a relativistic electron beam with a few femtosecond (fs) duration. Recently, a THz oscilloscope was proposed for hundred-fs metrology with a significantly increased dynamic range, which used a circular polarized THz pulse instead of a linearly polarized one. In this paper, we propose a THz oscilloscope for temporal characterization of relativistic electron beam with few picosecond (ps) duration, which is crucial for THz free-electron lasers and Thomson scattering X-ray sources, etc.