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28nm FDSOIフリップフロップ設計のSEU性能の評価【Powered by NICT】
28nm FDSOIフリップフロップ設計のSEU性能の評価【Powered by NICT】
2017
Wang H.-B.
J. S. Kauppila
K. Lilja
M. Bounasser
L. Chen
M. Newton
Li Q
Rui Liu
B. L. Bhuva
Wen S.-J.
R. Wong
Rita Fung
Sanghyeon Baeg
L W Massengill
Keywords:
Physics
Nuclear magnetic resonance
Engineering physics
Electronic engineering
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