Micro-Fabric Analyzer (MFA): A New Semiautomated ArcGIS-Based Edge Detector for Quantitative Microstructural Analysis of Rock Thin-Sections

Micro-Fabric Analyzer (MFA) is a new GIS-based tool for the quantitative extrapolation of rock microstructural features that takes advantage both of the characteristics of the X-ray images and the optical image features. Most of the previously developed edge mineral grain detectors are uniquely based on the physical properties of the X-ray-, electron-, or optical-derived images; not permitting the exploitation of the specific physical properties of each image type at the same time. More advanced techniques, such as 3D microtomography, permit the reconstruction of tridimensional models of mineral fabric arrays, even though adjacent mineral grain boundaries with the same atomic density are often not detectable. Only electron backscatter diffraction (EBSD) allows providing high-performing grain boundary detection that is crystallographically differentiated per mineral phase, even though it is relatively expensive and can be executed only in duly equipped microanalytical laboratories by suitably trained users. Instead, the MFA toolbox allows quantifying fabric parameters subdivided per mineral type starting from a crossed-polarizers high-resolution RGB image, which is useful for identifying the edges of the individual grains characterizing rock fabrics. Then, this image is integrated with a set of micro-X-ray maps, which are useful for the quantitative extrapolation of elemental distribution maps. In addition, all this is achieved by means of low-cost and easy-to-use equipment. We applied the tool on amphibolite, mylonitic-paragneiss, and -tonalite samples to extrapolate the particle fabric on different metamorphic rock types, as well as on the same sandstone sample used for another edge detector, which is useful for comparing the obtained results.