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半導體製程資料特徵萃取與資料挖礦之研究; Semiconductor Manufacturing Data Mining for Clustering and Feature Extraction
半導體製程資料特徵萃取與資料挖礦之研究; Semiconductor Manufacturing Data Mining for Clustering and Feature Extraction
2003
C. F. Chien
P R Lee
C.-Y. Peng
Keywords:
Cluster analysis
Semiconductor device fabrication
Decision analysis
Data mining
Decision tree
Feature extraction
Pattern recognition
Computer science
Artificial intelligence
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