Modeling of Grazing-Incidence X-ray Diffraction from Naphthyl End-Capped Oligothiophenes in Organic Field-Effect Transistors

The structure of two naphthylene-capped oligothiophene, 5,5′-bis(naphth-2-yl)-2,2′- bi- and tri- thiophene, thin-film field-effect transistor assemblies has been studied using modeling in conjuncti...