Density Distribution Profiles of Excess Minority Carriers Injected with 904-nm-Wavelength Laser Pulse into 400-µm-Thick Silicon Wafer

On numerically resolving the continuity equation for excess photocarriers, three-dimensional-type carrier distribution profiles in time and space have been obtained using a commercially available computer code. These pictures are useful for the quick understanding of the basic principle of the microwave-detected photoconductive decay method.