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Measurement of diffraction properties of photon sieves applied to spectroscopy for soft X-ray
Measurement of diffraction properties of photon sieves applied to spectroscopy for soft X-ray
2011
Wei Lai
Cao Leifeng
Fan Wei
Zang Hua-Ping
Gao Yulin
Zhu Xiaoli
Xie Changqing
Gu Yuqiu
Zhang Bao-Han
Wang Xiaofang
Keywords:
Spectroscopy
Nuclear magnetic resonance
Soft X-ray emission spectroscopy
Diffraction
X-ray
Physics
Photon
soft x ray
Correction
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