Deep Aspheric Testing Based on phase-shift Electronic Moiré Patterns
2003
The resolutions of CCD camera and digital computer are limited by Nyquist frequency when deep aspheric wavefronts are tested using phase-shifting technique. A new powerful technique based on parallel generations of three phase-shift patterns through electronic multiplication with computer- generated graftings and low pass filtering, is proposed for measuring wavefronts with large departures from a reference sphere such as those encountered during testing of steep aspheric surfaces. The phase distribution of aspheric surfaces is obtained using a three-step phase-shifting algorithm.
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