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Compaction of Pass/Fail-based Diagnostic Test Vectors for Combinational and Sequential Circuits
Compaction of Pass/Fail-based Diagnostic Test Vectors for Combinational and Sequential Circuits
2006
Yoshinobu Higami
K Saluja Kewal
Hiroshi Takahashi
Kobayashi Shin-ya
Yuzo Takamatsu
Keywords:
Real-time computing
Compaction
Sequential logic
Diagnostic test
Computer science
Algorithm
Correction
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