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Charge trapping behavior and its origin in Al2O3/SiC MIS system
Charge trapping behavior and its origin in Al2O3/SiC MIS system
2015
Xinyu Liu
Yiyu Wang
pengzhaoyang
Chengzhan Li
Jia Wu
baiyun
Yidan Tang
liukean
Huajun Shen
Keywords:
Atomic physics
Ceramic materials
Materials science
Trapping
Optoelectronics
Correction
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