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Characterization of Temperature Dependence of Parasitic Diodes of SiC JFETs for Transient Thermal Resistance Measurement
Characterization of Temperature Dependence of Parasitic Diodes of SiC JFETs for Transient Thermal Resistance Measurement
2012
T. Kim
T Funaki
Keywords:
Electronic engineering
Materials science
Diode
Thermal resistance
Optoelectronics
Correction
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