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A correlative EBSD, EBIC and APT study of grain boundary segregation in multicrystalline silicon
A correlative EBSD, EBIC and APT study of grain boundary segregation in multicrystalline silicon
2014
Andreas Stoffers
Oana Cojocaru-Mirédin
W. Seifert
Stefan Zaefferer
Dierk Raabe
Keywords:
Correlative
Metallurgy
Grain boundary
Electron backscatter diffraction
Silicon
Materials science
Correction
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