Surface layer analysis by MEIS using a solid state detector

Abstract In medium energy ion backscattering experiments (MEIS) it is shown that the energy resolution of a surface barrier detector (5 keV for 200 keV protons) is adequate for measuring surface blocking dips. In combination with bulk blocking measurements such dips can give information on the surface structure of single crystals. Compared to an electrostatic analyzer, the use of a surface barrier detector reduces the required ion dose by a factor of at least 25. Different methods for background subtraction in single-aligned backscatter-spectra are discussed. In addition possible beam-induced effects on surface disorder and contamination are studied. Ni-(110) was used as target material.