Method and device characterization in three dimensions of a surface of an object

The present invention relates to a method for characterizing a three-dimensional object (5), comprising: - a data acquisition distances on two measuring planes (81, 82) separate by at least three interferometric distance sensor (71 , 72) by measuring plane and rotation for several values ​​of the object about an axis of rotation (4); and for each measurement plan, obtaining data representative of a contour line (14) of the object from the distance data; - for one of the measurement planes, acquisition, by an image sensor (151), a three-dimensional image of a face of the object (5) and a reiteration of the image acquisition for several values ​​of rotation of the object (5) about its axis of rotation (4); and an assembly of different three-dimensional images acquired for this measurement plane (81), so as to obtain three-dimensional data of a contour of the object surface, the assembly comprising a definition of the relative positions of different images by means of data representative of the contour line (14) contained in the measurement plane (81).