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Robustness Study of SiC MOSFET Under Harsh Electrical and Thermal Constraints
Robustness Study of SiC MOSFET Under Harsh Electrical and Thermal Constraints
2014
Mbarek Safa
Pascal Dherbecourt
Olivier Latry
F. Fouquet
Othman Dhouha
Mounira Berkani
Stéphane Lefebvre
Keywords:
Robustness (computer science)
Electronic engineering
MOSFET
Thermal
Materials science
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