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In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures
In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures
2014
E. Niehuis
Rudolf Moellers
Felix Kollmer
Henrik Arlinghaus
Laetita Bernard
Hans Josef Hug
Sasa Vranjkovic
Raphaelle Dianoux
Adi Scheidemann
Keywords:
Nanostructure
Analytical chemistry
In situ
Materials science
Nanotechnology
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