Processing of X-Ray Diffraction Data in Structure Investigations of Amorphous Metal Oxides

The usual algorithm of the structure factor calculation, which is widely used for amorphous metals and amorphous semiconductors, cannot be applied to a number of amorphous metal oxides. Instead, we have developed a new algorithm based on the middle line method. It uses analytical properties of the structure factor and radial distribution function. The method has been applied to amorphous PbTiO 3 .