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Accelerated Testing of SiC Power Devices under High-Field Operating Conditions
Accelerated Testing of SiC Power Devices under High-Field Operating Conditions
2020
Daniel J. Lichtenwalner
Shadi Sabri
Edward Van Brunt
Brett Hull
Sei-Hyung Ryu
Philipp Steinmann
Amy Romero
Jae Hyung Park
Satyaki Ganguly
Donald A. Gajewski
Jim Richmond
Scott Allen
John W. Palmour
Keywords:
Engineering physics
Power semiconductor device
Metallurgy
high field
Materials science
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