Photoluminescence of 2D-vertical In-rich APBs embedded in InGaP/SiGe/Si

III-V/Si epitaxial nanostructure materials are quite promising candidates for the development of Si photonics. We deeply investigate the structural and optical properties of an InGaP/SiGe/Si platform by transmission electron microscopy, X-ray diffraction, energy-dispersive X-ray elemental mapping and photoluminescence techniques and we demonstrate the contribution of 2D-vertical In-rich antiphase boundaries (APBs) to the photoluminescence. The nonstoichiometric In-rich APB structures are found to be responsible for the localization of excitons.