Apparatus for testing electronic components, in particular IC's, with disposed within a pressure chamber test Abdichtboard

Apparatus for testing electronic components, in particular ICs, under specific pressure conditions, with the following features: - the apparatus comprises a divisible pressure test chamber having two separable and movable together pressure chamber halves (1, 2) which are mutually engageable in a contact position in which they enclose a cavity, - the pressure test chamber has contact elements (13), which extend into the cavity such that contacts to be tested and disposed in the cavity components can be brought (18) with associated contact elements (13) in contact, - the contact elements (13) extend through one of the pressure chamber halves (1, 2) pass, and are connected to an electronic test device in electrical contact, - each contact member (13) is divided by penetrating into the pressure chamber half (2) first contact element portion (19) and a portion of the first contact element (19) spaced apart second contact element portion (20) disposed within the cavity, characterized in that an air-impermeable Abdichtboard (26) is disposed within the cavity, the ...