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Design and Verification of Analog CMOS Circuits Using the g m / I D -Method with Age-Dependent Degradation Effects.
Design and Verification of Analog CMOS Circuits Using the g m / I D -Method with Age-Dependent Degradation Effects.
2017
Timur Schafer
Theodor Hillebrand
Nico Hellwege
Marco Erstling
Dagmar Peters-Drolshagen
Steffen Paul
Keywords:
Electronic circuit
Electronic engineering
Engineering
CMOS
Degradation (geology)
age dependent
Correction
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